Detection of a Nanoscale Hot Spot by Hot Carriers in a Poly-Si TFT Using Polydiacetylene-Based Thermoresponsive Fluorometry
Author :
J.-M. Choi, S.-J. Choi, O. Yarimaga, B. Yoon, J.-M. Kim*, Y.-K. Choi
Journal :
IEEE TRANSACTIONS ON ELECTRON DEVICES, 58, 1570-1574
Publication Date :
2011-03-10
Papers :
papers
Update Date :
16-07-20 15:01
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