Recent functional material based approaches to prevent and detect counterfeiting
Author :
B. Yoon, J. Lee, I. S. Park, S. Jeon, J. Lee, J.-M. Kim*
Journal :
Journal of Materials Chemistry C, 1, 2388-2403
Publication Date :
2013-01-21
Papers :
papers
Update Date :
16-07-20 15:33
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